Programme Submenu: [ Final Circular ] [ Programme Schedule ] [ Keynote Lectures ] [ Symposia­final details ] [ Tutorials ] [ Open Labs ] [ Workshops ] [ Electron Crystallography Workshop ] [ Seminar on Recent Trends ] [ EM in viral diagnosis ]
Symposia Submenu: [ B1 ] [ B2 ] [ B3 ] [ B4 ] [ B5 ] [ B6 ] [ B7 ] [ B8 ] [ B9 ] [ B10 ] [ B11 ] [ B12 ] [ B13 ] [ B14 ] [ B15 ] [ B16 ] [ B17 ] [ B18 ] [ B19 ] [ Bpd ] [ P1 ] [ P2 ] [ P3 ] [ P4 ] [ P5 ] [ P6 ] [ P7 ] [ P8 ] [ P9 ] [ P10 ] [ P11 ] [ P12 ] [ P13 ] [ P14 ] [ P15 ] [ P16 ] [ Ppd ] [ I1 ] [ I2 ] [ I3 ] [ I4 ] [ I5 ] [ I6 ] [ I7 ] [ I8 ] [ I9 ] [ I10 ] [ I11 ] [ I12 ] [ I13 ] [ I14 ] [ I15 ] [ I16 ] [ I17 ] [ Ipd ]  

Ipd Instrumentation and methodology - post-deadline posters [Tuesday, July 11, 13.30-14.50] Ipd-1 A comparison of surface roughness as measured by Dektak3St profiller, Hommel Tester 1000 and atomic force microscope         F. Farshad Ipd-2 Linear thickness dependence of electron contrast in single crystal gold films in the TEM         I. Pozsgai, L. Tóth Ipd-3 An in-situ nanosecond mirror electron microscope         H. Kleinschmidt, O. Bostanjogllo Ipd-4 Time-resolved transmission electron microscopy on laser-pulse-induced melts in glass films         H. Dömer, O. Bostanjogllo Ipd-5 Analysis of strain-balanced semiconductor layers by high resolution electron microscopy         H. Meidia, C.J.D. Hetherington, J.S. Roberts, A.G. Cullis Ipd-6 The Philips Tecnai TEM: applications and possibilities in life and materials sciences         M.M.H. Storms, D. Hubert, U. Lücken, T. Fliervoet, B. Freitag, M. Sidorov, W. Busing Ipd-7 Enhancing the detection efficiency of a SEM MCP detector by a coated thin foil         I. Shariv, Y. Karni, E. Elizur, E. Cheifetz

---

Updated by webmaster Petr Schauer on Jun 29, 2000