Programme Submenu: [ Final Circular ] [ Programme Schedule ] [ Keynote Lectures ] [ Symposiafinal details ] [ Tutorials ] [ Open Labs ] [ Workshops ] [ Electron Crystallography Workshop ] [ Seminar on Recent Trends ] [ EM in viral diagnosis ]
| O1 | CANCELLED |
| O2 | TEM sample preparation with focused ion beams (FEI / Philips Electron Optics) |
| O3 | CANCELLED |
| O4 | Ultramicrotomy of industrial materials (Diatome / Leica) |
| O5 | Specimen preparation for TEM (Gatan) |
| O6 | Latest developments in Gemini high resolution imaging (LEO Electron Microscopy) |
| O7 | User interfaces (Oxford Instruments Analytical) |
| O8 | Cryo-SEM (Oxford Instruments Analytical) |
| O9 | TEM specimen preparation for materials science (South Bay Technology) |
| O10 | TEM sample preparation (Technoorg Linda) |
| O11 | Digital image processing and electron tomography (Tietz Video&Image Processing Systems) |
| O12 | Contamination free TEM specimen preparation (Fischione Instruments) |
| O13 | Image processing and analysis of single biological macromolecules (Image Science Software) |
| O14 | EFTEM in practice (LEO Electron Microscopy) |
| O15 | Digital imaging (LEO Electron Microscopy) |
| O16 | Automatic particle analysis and classification (Hitachi Scientific Instruments, Oxford Instruments) |
| O17 | Secondary electron imaging in variable pressure mode (LEO Electron Microscopy) |
| O18 | Future of analytical imaging (Gatan) |
| O19 | Low keV operation with a tungsten emitter SEM (Hitachi Scientific Instruments) |
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Updated by webmaster Petr Schauer on Jun 29, 2000 |
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