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T1 |
TEM Specimen Preparation in the Physical Sciences |
| R. Anderson, New York L. Madsen, Linkoping |
[Room: , Tuesday, July 11, 2000, 12:00-15:00] |
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T2 |
Quantitative EELS |
| F. Hofer, Graz | [Room: CHV, Sunday, July 9, 15:00-18:00] |
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T3 |
Docking X-ray data into EM structures |
| R. Schroeder, Heidelberg | [Room: , Wednesday, July 12, 12:00-15:00] |
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T4 |
Immunoelectron microscopy and labelling techniques |
| J. E. Beesley, Stevenage | [Room: , Thursday, July 13, 12:00-15:00] |
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T5 |
Quantitative high-resolution EM and electron diffraction |
| H. W. Zandbergen, Delft | [Room: , Monday, July 10, 12:00-15:00] |
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T6 |
Very low energy in a standard SEM |
| I. Müllerová, L. Frank, Brno | [Room: CHV, Sunday, July 9, 12:00-15:00] |
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Updated by webmaster Petr Schauer on Jun 29, 2000 |
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