XII EUREM, Brno 2000
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I15 Filters, analysers and detectors
[Friday, July 14, 09.30-12.00, Room B]
Chair: B. Jouffrey, Chatenay-Malabry; P. Schauer, Brno;
Oral presentations:
09.30-09.55 On actual questions in filtering and inelastic interactions (invited)
        B. Jouffrey, P. Schattschneider, C. Hébert, M. Nelhiebel
09.55-10.20 Performance of detector elements for electron microscopes (invited)
        P. Schauer, R. Autrata
10.20-10.40 Design of a monochromator for electron sources
        F. Kahl, H. Rose
10.40-11.00 First development step and test of the SESAM/SATEM
        S. Kujawa
11.00-11.20 Software for the analysis and design of imaging energy filters with homogeneous and inhomogeneous bending magnets
        E. Munro, J. Rouse
11.20-11.40 Performance data of a new 2048 x 2048 pixel slow-scan CCD camera for TEM
        S.A. Hiller, B. Kabius, W. Probst, H. Tröster, M. Trendelenburg, C. Crucifix, A. Tröndle
11.40-12.00 Geometric distortion correction for imaging plates using reflected light signal improves gain normalization and DQE
        P.Bele, R. Ochs, R.R. Schröder
Posters: [Thursday, July 13, 13.30-14.50]
I15-1 Cryodetectors for high resolution X-Ray spectroscopy
        J. Höhne, M. Bühler, T. Hertrich, U. Hess
I15-2 Scanning electron microscopy of semiconductor multilayers using a converter of backscattered electrons into secondary electrons
        P. Ascarelli, E. Capelli, F.Corticelli, S. Franchi, P.G.Merli, A.Migliori, V. Morandi, C. Rossi, S.Salvatori, A. Valdre
I15-3 Simulation of electron trajectories in the 3D field of two coupled hemispherical electrostatic deflectors
        A. Huber, E. Plies
I15-4 New possibilities of SEBIV mode in SEM
        B. Degel, M. Kienle, E. Plies, E. I. Rau, S. Zhu
I15-5 Detection of the angular distribution of the signal electrons in VLESEM
        M. Horáèek
I15-6 Direct electron exposed silicon detectors in EELS
        C. Orsholm, S. Csillag
I15-7 Auger microscopy with a parallel acquisition spectrometer
        M. Jacka, A. Kale, M. Tyndall, M. Prutton
I15-8 Elemental mapping using omega filter and imaging plate
        D. Shindo, Y. Ikematsu, C.-W. Lee, Y. Murakami, M. Sugiyama
I15-9 New frame-transfer wide-angle slow-scan CCD camera allows recording of distortion-free images for digital montages 
        S.A. Hiller, W. Probst, V. Seybold, E. Zellmann, B. Kabius, A. Tröndle
I15-10 Combined TEM and CL of self-assembled CdSe quantum dots
        H. Preis, P. Müller, K. Fuchs, S. Kaiser, W. Gebhardt, J. Zweck



Updated by webmaster
Petr Schauer
on Jun 29, 2000
EUREM2000 Home Page Whats New General Information Contact Addresses Programme Exhibition Call for Papers Registration Accommodation 2nd Circular City of Brno Tours & Trips Archive of the Web Site CS. Society for El. Microscopy