P07 |
Epitaxial structures and nanostructures |
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[Wednesday, July 12, 16.00-18.30, Room B] |
Chair: |
G. van Tendeloo, Antwerp; P. G. Merli, Bologna; |
Oral presentations: |
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16.00-16.40 |
Scanning electron microscopy of epitaxial structures
(invited)
P.G.
Merli, A. Migliori, V. Morandi |
16.40-17.20 |
HRTEM of epitaxial structures from high-Tc materials
(invited)
K. Verbist |
17.20-17.35 |
Structural characterisation of (GaIn)(NAs)/GaAs multi-quantum
wells grown by MOVPE
K. Volz,
A.K. Schaper, A. Hasse, T.E. Weirich, F. Höhnsdorf, J. Koch, W. Stolz |
17.35-17.50 |
Study of the effect of vertical size uniformity on diffraction
contrast images of stacked In(x)Ga(1-x)As/GaAs quantum dots
A. Taurino,
M. Catalano, M. De Giorgi, A. Passaseo, R. Cingolani |
17.50-18.05 |
Extracting structural parameters of quantum dots
X.Z. Liao,
J. Zou, D.H.J. Cockayne, R. Leon, C. Lobo, Z.M. Jiang, X. Wang |
18.05-18.20 |
Influence of the growth duration on the In concentration
in epitaxial InGaN layers
B. Neubauer,
A. Rosenauer, D. Gerthsen, O. Schön, M. Heuken |
Posters: |
[Tuesday, July 11, 13.30-14.50] |
P07-1 |
HRTEM study of the structure of nanoparticles of beta-zeolite
E. Liubich,
M. Talianker |
P07-2 |
Effect of oxygen treatment of epitaxial (001) SrTiO(3)
thin films
L. Ryen,
P.K. Petrov, Z.G. Ivanov, E. Olsson |
P07-3 |
CoSi(2) growth on Si(1-x)C(x)(001) substrates
M. Falke,
S. Teichert, H. Giesler, G. Beddies, H.-J. Hinneberg |
P07-4 |
TEM on wurtzite AlN films on Si(001) substrates
J. Jinschek,
U. Kaiser, V. Lebedev, W. Richter |
P07-5 |
Investigation of rocksalt surfaces as substrate for epitaxial
growth of thin films after treatment with water and chlorine gas
P. Ott,
J.R. Günter |
P07-6 |
Electron microscopy investigations of the growth of manganese
silicide films on Si(001)
A. Mogilatenko,
M. Falke, S. Teichert, D. Sarkar, H.-J. Hinneberg |
P07-7 |
TEM investigations of self-organization phenomena in
stacked InAs/GaAs quantum dots
H. Kirmse,
R. Schneider, W. Neumann, E. Steimetz, W. Richter |
P07-8 |
Nanostructure of epitaxial ReSi(1.75) thin films on Si
D. Hofman,
Ch. Kleint, J. Thomas, K. Wetzig |
P07-9 |
Direct strain measurements in InP/GaInP quantum dots
by HREM
N.Y. Jin-Phillipp,
F. Phillipp |
P07-10 |
Defects and nanowire formation on TiTe(2) layered crystals
C. Dieker,
R. Adelung, L. Kipp, M. Skibowski, W. Jäger |
P07-11 |
HRTEM image processing analysis of nanocrystalline iron-titanium
powders
A. M. Tonejc,
I. Djerdj, A. Tonejc |
P07-12 |
Application of TEM energy filtered measurements to the
study of Ge redistribution in ion-implanted thin SiO(2) films
M. Klimenkov,
J. v. Borany, W. Matz, S. Schulze |
P07-13 |
HRTEM of epitaxial growth of Ni-rich Ni-Al thin films
onto Ag
M. Yandouzi,
D. Schryvers, L. Toth |
P07-14 |
Micro-, atomic and surface structure of epitaxial silver
thin films evaporated onto NaCl
M. Yandouzi,
M. Cannaerts, C. Van Haesendonck, L. Toth, D. Schryvers |
P07-15 |
TEM Study of BaTiO(3) films used as wave guides
C. Lei,
C.L. Jia, M. Siegert, K. Urban |
P07-16 |
A transmission electron microscopy study of the depth
distribution of excess Ga or As during recrystallisation of amorphous GaAs
D. J. Llewellyn,
K. B. Belay, M. C. Ridgway |
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