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I14 Electron optical systems, guns and lenses [Thursday, July 13, 16.00-18.30, Room F] Chair: P. Kruit, Delft; V. Kolařík, Brno; Oral presentations: 16.00-16.40 Modern electron optics in SEM and inspection (invited)         E. Plies 16.40-17.20 Advances in TEM instrumentation (invited)         P. Kruit 17.20-17.35 A high resolution add-on lens for scanning electron microscopes         A. Khursheed, N. Karuppiah, S.H. Koh 17.35-17.50 Advances in high-throughput multiple electron-beam lithography         M. Mankos, T. H. P. Chang 17.50-18.05 Investigations of an electrostatic duo-hexapole-stigmator         J. Bärtle, E. Plies 18.05-18.20 SEM resolution improvement at low voltage with gun monochromator         J.E. Barth, M.D. Nykerk, H.W. Mook, P. Kruit Posters: [Thursday, July 13, 13.30-14.50] I14-1 Construction and characterisation of a TEM specimen holder for in situ application of magnetic in-plane fields         T. Uhlig, M. Heumann, M. Schneider, H. Hoffmann, J. Zweck I14-2 On the enhancement factors for electron field emitters         C. Edgcombe, U. Valdre I14-3 Investigation of an EuS-coated cooled field emitter for application in state on the art electron microscopes         H. Wittel, A. Schäfer, F. Hasselbach I14-4 Test specimens for SEM         F. Matějka, Z. Ryzí I14-5 Field emission SEM with a newly developed FEGUN and a conical strongly excited objective lens         H. Kazumori, A. Yamada, M. Mita, T. Nokuo, M. Saito

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