| I04 |
Correction of aberrations and
HR electron microscopes |
|
[Tuesday, July 11, 16.00-18.30, Room B] |
| Chair: |
A. Delong, Brno; M. Haider, Heidelberg; |
| Oral presentations: |
|
| 16.00-16.35 |
Towards sub-Angstrom point resolution by correction of
spherical aberration (invited)
M. Haider |
| 16.35-17.10 |
Advances in Cs-corrected STEM (invited)
O.L.
Krivanek, N. Dellby, A.R. Lupini |
| 17.10-17.25 |
Correction of chromatic and spherical aberration using
a Wien filter
T. Steffen,
P.C. Tiemeijer, M.P.C.M. Krijn, S.A.M. Mentink |
| 17.25-17.40 |
Performance of the mirror corrector for an ultrahigh-resolution
spectromicroscope
P. Hartel,
D. Preikszas, R. Spehr, H. Rose |
| 17.40-17.55 |
An electrostatic achromat
A. Henstra,
M.P.C.M. Krijn |
| 17.55-18.10 |
Electrostatic correction of the chromatic and spherical
aberration of charged particle lenses
Ch.
Weissbaecker, H. Rose |
| 18.10-18.25 |
Super resolution imaging of complex metal oxides
A. I.
Kirkland, J. Sloan, R. Meyer, R. E. Dunin-Borkowski, J. L. Hutchison,
W. O. Saxton, M. J. Sayagués, R. J. D. Tilley |
| Posters: |
[Monday, July 10, 13.30-14.50] |
| I04-1 |
Validity of spherical aberration free focus condition
H.Endoh,
H.Hashimoto, A.Kumao |
| I04-2 |
The Triebenberg laboratory - designed for highest resolution
electron microscopy and holography
H. Lichte,
D. Schulze, M. Lehmann, H. Just, T. Erabi, P. Fürst, J. Göbel, A. Hasenpusch,
P. Dietz |
| I04-3 |
A new method for the determination of the wave aberration
function
R. R. Meyer,
A. I. Kirkland, W. O. Saxton |
|
