| I03 |
Quantitative electron microscopy |
|
[Thursday, July 13, 09.30-12.00, Room B] |
| Chair: |
D. Van Dyck, Antwerp; F. Ernst, Stuttgart; |
| Oral presentations: |
|
| 09.30-10.10 |
Advances in atomic structure determination using the
focal-series reconstruction technique (invited)
A. Thust,
C.L. Jia |
| 10.10-10.50 |
Progress in structure analysis of crystal defects by
quantitative HRTEM (invited)
R. Schweinfest,
F.
Ernst |
| 10.50-11.05 |
Image formation using incoherent scattering in a CTEM
G. R
Anstis |
| 11.05-11.20 |
Extension of HRTEM resolution using Gerchberg-Saxton
algorithm: application to grain boundary and interface
F.-R.
Chen, J. J. Kai, L. Chang |
| 11.20-11.35 |
Effect of the objective lens on the measurement of rapidly
varying displacement fields from HRTEM images
M. Hytch,
T. Plamann |
| 11.35-11.50 |
The effect of strain on chemically sensitive imaging
with the (002) reflection in sphalerite type crystals
A. Rosenauer,
D. Van Dyck |
| Posters: |
[Monday, July 10, 13.30-14.50] |
| I03-1 |
Parallel realization of the simulated annealing algorithm
and its applications to quantitative electron microscopy
S.-Y. Li,
M.-Y. Wu, J. Zhu |
| I03-2 |
Quantitative measurement of intensity profiles of equal
thickness fringes of Si and MgO crystals and estimation of crystal potential
K. Nishio,
T. Isshiki, E. Okunishi, T. Oikawa, M. Kawasaki, H. Endoh, M. Shiojiri |
| I03-3 |
A Fourier space approach for calculating the electron
optical phase shift of superconducting fluxons
M. Beleggia,
G. Pozzi, A. Tonomura |
| I03-4 |
Design aspects for an optimum DF STEM probe
S. Van
Aert, A.J. den Dekker, D. Van Dyck, A. van den Bos |
| I03-5 |
A quantitative evaluation of different STEM imaging modes
A.J. den
Dekker, S. Van Aert, D. Van Dyck, A. van den Bos |
| I03-6 |
Accurate measurements of atomic displacements in La(0.9)Sr(0.1)MnO(3)
thin films grown on a SrTiO(3) substrate
P. Geuens,
O.I. Lebedev, D. Van Dyck, G. Van Tendeloo |
| I03-7 |
Direct object data retrieval: an inversion of electron
diffraction
K. Scheerschmidt |
| I03-8 |
Influence of experimental parameters on the accuracy
of lattice-distortion measurements directly from high-resolution micrographs
K. Du,
N.Y. Jin-Phillipp, F. Phillipp |
| I03-9 |
EELS thickness-measurement without spectrum acquisition
M. Tanaka |
| I03-10 |
Contrast modulations in HRTEM images caused by crystal
tilt
T. Waitz,
H.P. Karnthaler |
