I01 |
Wave and particle properties
of the electron |
|
[Wednesday, July 12, 09.30-12.00, Room F] |
Chair: |
M. Lenc, Brno; H. Lichte, Dresden; |
Oral presentations: |
|
09.30-10.05 |
New experiments in charged particle interferometry and
quantum statistics (invited)
F. Hasselbach |
10.05-10.40 |
Off-axis electron holography - the way to use (invited)
H. Lichte,
M. Lehmann |
10.40-10.55 |
Electrons as waves - and what will come next?
T. Tyc,
M. Lenc |
10.55-11.10 |
An electron antibunching experiment
H. Kiesel |
11.10-11.25 |
Time-resolved observation in transmission electron microscopy
using electron correlation measurement
N. Osakabe |
11.25-11.40 |
Partial coherence and HREM image simulation
H. Müller,
P. Schorsch, H. Rose |
11.40-11.55 |
Assessment of the experimental constraints for phase
contrast EM and complex object reconstruction
E.Majorovits,
K.Nagayama, R.R.Schröder |
Posters: |
[Monday, July 10, 13.30-14.50] |
I01-1 |
Correction of the Fresnel diffraction caused by the biprism
filament in phase-shifting electron holography
K. Yamamoto,
T. Tanji, T. Hirayama, M. Hibino |
I01-2 |
Complex electron microscopy
K. Nagayama,
R. Danev, H. Okawara, K. Murata |
I01-3 |
Off-axis electron holography of focused ion beam milled
transistors
R.E. Dunin-Borkowski,
S.B. Newcomb , D. Doyle, A. Deignan, M.R. McCartney |
I01-4 |
Miniaturized biprism interferometer for wide separation
of the coherent beams
H. Prochel,
F. Hasselbach |
I01-5 |
Holographic studies of thin manganite films
M. Lehmann,
T. Walter, K. Dörr |
I01-6 |
Inelastic electron holography
H. Lichte,
B. Freitag |
I01-7 |
Comparison of accuracy of electron holography and EELS
on thickness measurement of amorphous SiO(2)
C.-W. Lee,
Y. Ikematsu, D. Shindo |
I01-8 |
Two-dimensional mapping of electrostatic potential in
a SiC MESFET using electron holography
A.C. Twitchett,
S.J. Lloyd, M. Lehmann, P.A. Midgley |