| P15 |
General materials microscopy |
|
[Wednesday, July 12, 16.00-18.30, Room A] |
| Chair: |
J. Van Landuyt, Antwerp; K. M. Knowles, Cambridge; |
| Oral presentations: |
|
| 16.00-16.40 |
Analysis of nanostructures by EM techniques: Quantum
dots (invited)
K. Scheerschmidt,
P. Werner |
| 16.40-17.20 |
Electron microscopy and microanalysis of electronic ceramics
(invited)
K.M.
Knowles |
| 17.20-17.35 |
A TEM study of non-parallel twins inducing thickness
growth in silver chloride (111) tabular crystals
W. Van
Renterghem, D. Schryvers, J. Van Landuyt, D. Bollen, C. Van Roost,
R. De Keyzer |
| 17.35-17.50 |
Defects in semiconductor materials studied with cathodoluminescence
microscopy
H. Saijo,
T. Isshiki, M. Shiojiri |
| 17.50-18.05 |
Structure and identification of some metastable phases
in Mg-rare earth alloys
B. Smola,
I. Šulíková |
| 18.05-18.20 |
Morphology and interfaces of macropores in n- and p-Si(001)/(111)
C. Jäger,
C.
Dieker, W. Jäger |
| Posters: |
[Thursday, July 13, 13.30-14.50] |
| P15-1 |
Investigations of microscopic fractures of Syrian cotton
about different maturity degree
A. Wlochowicz,
E. Sarna |
| P15-2 |
Microstructural characterization of superficial zones
on brake pads
I.Urban,
I.Dörfel, W.Österle, W.Gesatzke, P.Schubert-Bischoff, S.Trepte |
| P15-3 |
Electron microscopy study of Sn/SnSb composite electrodes
for lithium-ion batteries
I. Rom,
I. Papst, M. Schmied, F. Hofer, M. Wachtler, J. O. Besenhard, M.Winter |
| P15-4 |
Cathodoluminescence microscopy of defects induced in
SiC wafer
T. Isshiki,
H. Saijo, S. Nishino, M. Shiojiri |
| P15-5 |
Enhanced SEM doping contrast on an H-passivated silicon
surface
S. L. Elliott,
R. F. Broom, C. J. Humphreys |
| P15-6 |
Alumina membranes formed by anodical oxidation of aluminum
Z. Vértesy,
L.P. Biró, E. Veress, G. Mihailescu, S. Pruneanu |
| P15-7 |
Imaging of 2-D doping profiles using electron microscopy
S.A.M.
Mentink, M.H.F. Overwijk, M. Kaiser, M.A. Verheijen, C. Dachs, P.A. Stolk,
S.L. Elliott, C.J. Humphreys |
| P15-8 |
Possibilities for quantitative dopant profiling using
TEM/AFM and selective chemical etching
M.A. Verheijen,
M. Kaiser, J.G.M. van Berkum, C.J.J. Dachs, P.A. Stolk |
| P15-9 |
Morphology and composition of airborne particulate (PM2.5)
by transmission electron microscopy
D. Berti |
| P15-10 |
Behavior of H+ implantation induced defects during heating
H. Iwata,
M. Takagi, Y. Tokuda, T. Imura |
| P15-11 |
TEM analysis of nanocrystalline reaction layers in Ag-Cu-Ti
brazed silicon carbide
D.R. Ormston,
K.M. Knowles, S.B. Newcomb, J.A. Fernie |
| P15-12 |
Ordering in Hf(1-y)V(y)O(z) (y=0.1, 0.2, 0.3, 0.5): a
HREM and EELS study
Ch. Leroux,
Ch. Turquat, G. Nihoul, V. Serin, A. Gloter |
| P15-13 |
Silicides phase transformation in beta Ti-25V-15Cr-3Al-0.6Si
(wt%)
G. Kong,
Y.G. Li, P. Blenkinsop, M.H. Loretto |
| P15-14 |
Quantification of real air samples of asbestos fibres
by optical microscopy and transmission electron microscopy
J.M. Manero,
A. Freixa, E. Valles, J.A. Planell |
| P15-15 |
EPMA analysis of lead zirconium titanate (PZT) films
S. Bernik,
R.B. Marinenko, Z. Samardžija, B. Maliè, M. Èeh |
| P15-16 |
The TEM characterisation of a via sidewall etch residue
N. Pirila,
M. Weyland, S.B. Newcomb |
| P15-17 |
STM/AFM study of Ge quantum dots grown on Si(111)
F. Rosei,
M. Fanfoni, A.Sgarlata, N. Motta |
| P15-18 |
On the imaging of semiconductor doping using low energy
electron microscopy
M. El-Gomati,
T.C.R. Wells, L. Frank, I. Müllerová |
|
