| I06 |
Low vacuum microscopy and charging |
|
[Thursday, July 13, 16.00-18.30, Room A] |
| Chair: |
J. Cazaux, Reims; R. Autrata, Brno; |
| Oral presentations: |
|
| 16.00-16.40 |
Charging mechanisms in S.E.M.: from the secondary yield
to the contrast of images? (invited)
J. Cazaux |
| 16.40-17.05 |
Scanning electron microscopy at low vacuum in specimen
chamber (invited)
R. Autrata,
J. Jirák |
| 17.05-17.20 |
Possibilities of evaluation of the influence of conditions
in the specimen chamber on the quality of imaging in environmental SEM
M. Michálek,
J. Jirák |
| 17.20-17.35 |
ESEM as a routine tool for failure analysis in industry
D. van
der Wal, E. Baken |
| 17.35-17.50 |
ESEM and TEM investigations on experimentally corroded
synthetic zirconolite crystals and their replacing secondary phases
J. Malmström,
E. Reusser, R. Guggenheim, M. Düggelin, D. Mathys, R. Gieré, G.R.
Lumpkin, M.G. Blackford |
| 17.50-18.05 |
Structure degradation of austenitic stainless steels
as effect of corrosion fatigue
K. Palka,
B. Surowska, A. Weronski |
| 18.05-18.20 |
Absorbed electron imaging of non-conductive samples in
low-vacuum SEM
B. Hellum,
P. Reme, L.U. Hansen, P.O. Johnsen, J. Hjelen |
| Posters: |
[Tuesday, July 11, 13.30-14.50] |
| I06-1 |
SEM analysis of corrosion degradation on tinplate substrates
E. Zumelzu,
A. Vera, C. Cabezas |
| I06-2 |
Charging effects in S.E.M.: role of the working distance
F. Grillon,
J. Cazaux |
| I06-3 |
Studies of biological specimens by environmental scanning
electron microscopy
R. Autrata,
D. Horký, L. Ilkovics, V. Procházka, T. Skřička |
| I06-4 |
Microstructural and compositional changes at high temperature
oxidation of stainless steel in steam environment
F. A. Khalid,
N. Hussain, A.H. Qureshi |
| I06-5 |
Conditions of study of electrode masses structures in
environmental scanning electron microscope
R. Drnovský,
J. Jirák |
| I06-6 |
An anomalous contrast effect in scanning electron microscopy
of insulators: the pseudo-mirror effect
M. Belhaj,
O. Jbara, S. Odof, K. Msellak, J. Cazaux, E.I. Rau, M.V. Andrianov |
| I06-7 |
Spectral distribution of backscattered electrons of charged
insulators
O. Jbara,
M. Belhaj, S. Odof, E.I. Rau, M.V. Andrianov |
| I06-8 |
Combined scintillation and ionisation detectors for environmental
scanning electron microscopes
V. Romanovský,
R. Autrata |
| I06-9 |
Imaging of semiconductor structures in environmental
SEM
V. Romanovský,
O. Hutař |
| I06-10 |
Effect of the electron beam accelerating voltage and
of specimen coating on the image in the microscope operating at higher
pressures
R. Autrata,
J. Jirák, J. Špinka |
