| I10 |
EELS and EFTEM |
|
[Monday, July 10, 16.00-18.30, Room F] |
| Chair: |
F.Hofer, Graz; C. Humphreys, Cambridge; |
| Oral presentations: |
|
| 16.00-16.35 |
Understanding EELS and its applications to metallic alloys
and semiconductors (invited)
C. Humphreys |
| 16.35-17.10 |
Energy filtering transmission electron microscopy: fundamentals
and applications (invited)
H. Kohl |
| 17.10-17.25 |
Analysis of the atomic scale oxygen vacancy ordering
by EELS and Z- contrast imaging
Y. Ito,
S. Stemmer, R.F. Klie, N.D. Browning, T.J. Mazanec |
| 17.25-17.40 |
Extended image-series analysis in the energy-filtered
TEM
P.J.
Thomas, P.A. Midgley |
| 17.40-17.55 |
Composition and chemical shift analysis of a multilayer
using spatially-resolved EELS
K. Kimoto,
Y. Matsui, T. Aoyama |
| 17.55-18.10 |
Electron channeling and monopole transitions in ELNES
P. Schattschneider,
C. Hébert, B. Jouffrey |
| 18.10-18.25 |
Monochromator for high brightness electron guns
H.W.
Mook, P.E. Batson, P. Kruit |
| Posters: |
[Wednesday, July 12, 13.30-14.50] |
| I10-1 |
Application of EFTEM for cross-sectional on-product characterization
of semiconductor devices
H. J. Engelmann,
W. Blum, H. Saage, M. Worch, E. Zschech |
| I10-2 |
Extraction of three-body distribution in amorphous silicon
by wavelet analysis of EXELFS
S. Muto,
K.M. Yu, W. Walukiewicz, H.-Ch. Jin, J.R. Abelson |
| I10-3 |
Wavelet analysis of extended energy-loss fine structure
S. Muto |
| I10-4 |
Energy-filtering techniques for thick samples
B. Kabius,
V. Seybold, S. Hiller, A. Rilk, E. Zellmann, W. Probst |
| I10-5 |
EFTEM analysis of the interaction of Co with a fluorinated
organic dielectric
S. Hens,
J. Van Landuyt, H. Bender, F. Lanckmans, K. Maex |
| I10-6 |
Quantitative evaluation of short-range order diffuse
scattering in Cu(72.5)Pd(27.5) alloy by energy filter and imaging plate
Y. Ikematsu,
D. Shindo |
| I10-7 |
Cryo-EFTEM elemental mapping of particles in frozen solutions
J.-O. Bovin,
O. Balmes, G. Karlsson |
| I10-8 |
Electron energy-loss near-edge structures of silicon
and silicon carbide
M.Y. Park,
P. Krüger, H. Kohl |
| I10-9 |
Effect of the excited state lifetime on the near edge
structure in EELS or XANES experiments
C. Hébert,
M. Kostner, P. Schattschneider |
| I10-10 |
EELS study of phase transformation in Cu-Al-Ni alloy
T. Hanada,
R. Kitao, Y. Nakata, Y. Hirotsu |
| I10-11 |
Stability performance of an energy filtering TEM
G. Benner,
E. Zellmann, A. Harscher, R. Härle, B. Kabius, V. Seybold, W. Probst |
| I10-12 |
Factor analysis of TEM-EEL spectra on nanoscale Fe/Al/Fe
layers
J. Thomas,
H.-D. Bauer, S. Baunack, K. Wetzig, A. Mensch |
| I10-13 |
Beam brightness and STEM-EELS performance
J.E. Barth |
| I10-14 |
Factors affecting the performance of EELS energy-filters
G. Kothleitner,
H.A. Brink |
| I10-15 |
Energy-filtered imaging of Fe and Ni nanoparticles in
a field emission gun transmission electron microscope
M.J. Sayagués,
T.C. Rojas, R.E. Dunin-Borkowski, J.L. Hutchison, A. Fernández |
| I10-16 |
Direct atomic scale characterization of interfaces and
doping layers in field-effect transistors
T. Topuria,
E. James, N. Browning, Z. Ma |
