XII EUREM, Brno 2000
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I11 Surface oriented microanalytical techniques
[Tuesday, July 11, 16.00-18.30, Room H]
Chair: M. M. ElGomati, York; G. Schönhense, Mainz;
Oral presentations:
16.00-16.40 Photoemission electron microscopy with high chemical and magnetic sensitivity (invited)
        G. Schönhense
16.40-17.20 Auger analysis of sharp topographies: quantification at high spatial resolution (invited)
        M.M. El Gomati, A. Gelthorpe, J. Dell
17.20-17.35 Quantitative secondary electron emissiometry
        Y.Y. Tomashpolsky, N.V. Sadovskaya
17.35-17.50 Contrast studies on organic monolayers in FESEM and their correlation with SFM data
        A.G. Bittermann, R. Reichelt
17.50-18.05 Magneto-optical linear dichroism in threshold photoemission electron microscopy of a polycrystalline Fe-film
        G.K.L. Marx, H.-J. Elmers, G. Schönhense 
18.05-18.20 Structural and chemical surface analysis with the double-reflection emission electron microscope DREEM
        K. Grzelakowski, J. Settemeyer, M. Escher, M. Merkel
Posters: [Wednesday, July 12, 13.30-14.50]
I11-1 Secondary electron field emission microscopy - SEFEM
        H.-J. Fitting, Th. Hingst, E. Schreiber
I11-2 Possibilities of measurement of magnetic field distributions by photoemission electron microscopy
        S.A. Nepijko, N.N. Sedov, G.K.L. Marx , G. Schönhense
I11-3 Domain imaging and determination of magnetic moments in Co-films using XMCD-PEEM
        G.K.L. Marx, M. J. Klais, P. Haibach, G. Schönhense 


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Petr Schauer
on Jun 29, 2000 		EUREM2000 Home Page Whats New General Information Contact Addresses Programme Exhibition Call for Papers Registration Accommodation 2nd Circular City of Brno Tours & Trips Archive of the Web Site CS. Society for El. Microscopy