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I09 Quantitative X-ray spectroscopy in EM [Wednesday, July 12, 09.30-12.00, Room H] Chair: J. Wernisch, Vienna; M. Wendt, Jena; Oral presentations: 09.30-10.10 X-ray microanalysis at low kV (invited)         M. Wendt 10.10-10.50 Standardless microanalysis (invited)         J. Wernisch 10.50-11.10 Automated analysis of submicron particles in SEM?         P. Poelt, M. Schmied, T. Brunner 11.10-11.30 Correction of peak overlap in EDX-maps by digital image processing         M. von Bradke, R. Ruckdaeschel 11.30-11.55 Short presentations of posters Posters: [Wednesday, July 12, 13.30-14.50] I09-1 Standards for analysis of submicron particles by SEM / EDXS         M. Schmied, P. Poelt, J. Dahl I09-2 Combined autoradiography and electron microscopy analysis for granulometric measurements of actinide oxide aerosols         H. Le Naour, P. Fritsch  I09-3 Quantitative electron microprobe analyses of subsurface micro-inclusions in diamonds         V. Gutkin, E. Izraeli, O. Navon I09-4 The use of energy dispersive X-ray microanalysis (EDX) in pollution impact studies         M.A. Gregory, T.P. McClurg, A.D. Connell, V.E. Moodley I09-5 Characterisation of industrial TiO(2) pigments with low voltage FE-SEM/EDX and FE-TEM/STEM/EDX methods         U. Tapper, E.I. Kauppinen, J. Jalava

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